equipment introduction：
fully automatic optical inspection for the appearance of semiconductor microchips.six types of surface defect inspection for chip products, including scratches, imperfections, and dents.
product function：
highly integrated, utilizing limited space to integrate six robotic arms
extensive optical project accumulation, mature and efficient software algorithms
replaceable optical inspection module adaptable to various product sizes
automated optical inspection and recognition rate as 0.015 mm/pixel
photographing detection time ≤ 120ms, uph 6000-20000
measurable dut size: 2*2mm-10*10mm
